Testing and Evaluation (Technical Expertise)

Testing and Evaluation (Technical Expertise)

Laser Diodes

The EOC improves the reliability of laser diode packaging by combining numerical analysis, reliability testing, and forensic analysis. Using this diverse tool set, we are able to match simulation to the actual empirical data and determine specific root causes of failures and failure modes.

A core component of many next-generation laser weapons and laser-based systems is laser diodes. To ensure that our customers had access to high reliability diodes, the EOC developed a laboratory dedicated to comprehensive and independent testing, evaluation, and validation of laser diodes. Two of the main goals for the establishment of this laboratory were:

  • To implement a consistent process for test and evaluation of diodes and diode packages
  • Utilize test information and analysis to improve the reliability of laser diode packages

As a result, we are able to provide government agencies and commercial enterprises with independent analysis of their products and systems. The results of our analyses enabled our sponsors to increase reliability, improve manufacturers’ processes, and reduce the cost of the systems. We also provide the unique ability to test and perform forensic analysis of failure as well as assist in redesign using tools like FEA and thermal analysis.

RF Power Amplifier Testing

The EOC provides accelerated life-cycle testing and failure analysis of materials research for Transmit/Receive (T/R) modules. Our unique capability of analyzing device reliability and failure enables us to move the failure analysis from board level to device level. This information is provided to the manufacturers for incorporation into new device fabrication processes.

The EOC has established facilities that support accelerated life-cycle testing and failure analysis for T/R modules. In partnership with our sponsors, we closely monitor life-cycle and developed tests to predict lifetime using failure analysis tools such as GaN failure analysis, GaN physics of failure, and GaN Radar Reliability. We have cutting-edge testing equipment such as specialized semiconductor characterization equipment; Midwave Infrared Imaging for detecting heat associated with a failure; Scanning Acoustic Microscopy; X-ray Imaging; Focused Ion Beam/Scanning Transmission Electron Microscopy to detect atomic-scale disruptions in the semiconductor crystalline lattice; and Electron Beam Induced Current used in conjunction with Scanning Electron Microscope to detect to localized variations in electrical trap density, defect density and carrier lifetime.

Environmental Testing

An integral part of the EOC's ability to provide testing, evaluation and validation of electro-optic systems and components is our expertise in environmental testing. These efforts have significantly reduced system and equipment failures for our DoD Sponsors.

An integral part of the EOC’s ability to provide testing, evaluation and validation of electro-optic systems and components is our expertise in environmental testing. These efforts have significantly reduced system and equipment failures for our DoD Sponsors. We have developed the capability to perform highly accelerated stress screening, highly accelerated life testing, shock testing, sine sweeps, testing in varied humidity, and high-altitude testing over 100,000 feet.

We are dedicated to finding out why systems fail and to improve system longevity, and we will continue to modify and improve our failure analysis processes and pull together techniques for military applications in an attempt to make systems reliable for the Warfighter. Our goal is to ensure that EOC products and solutions will be successful in specified environments as well as offer our expertise to other businesses. As conditions dictate, we will continue to expand our capabilities to fill the niche testing areas which no longer may be available through the Government Laboratories and may be cost prohibitive for small business.